Spectrochemical Analysis

Electron Probe Microanalyzer (EPMA)

When the surface of a sample is irradiated with an electron beam, it emits X-rays specific to individual elements (characteristic X-rays). By measuring the intensities of characteristic X-rays, the electron probe microanalyzer analyzes the elemental composition of the sample, a microscopic area of the order of 10µm at a time. It can show the two-dimensional variation of elemental composition across the sample surface by scanning it with an election beam.

The combination of up to 3 wavelength dispersive X-ray spectrometers (WDS) and a newly developed energy dispersive X-ray spectrometer (EDS) analyzer featuring spectral imaging assures the most efficient and accurate analysis of data.

Model

JXA-8200

Manufacture

JEOL Ltd.

Operating condition

SEI resolution	6nm (@ WD11mm,30kV)
Accelerating voltage	0.2 \| E0kV
Beam current	10-12 \| E0-5A
Scaning image	SEI, BEI and Topographic images
Analytical method	Qualitative, qualitative, linear, two-dimensional, EDS
Standard sample	Oxide, mineral and rare earth element standard
Sample folder	OMTHL (for thinsection), LH9 (for mini-core)

Lab.

Spectrochemical Analysis

Laser Raman Spectrometer

Laser Raman Spectrometer is useful to determine chemical components and the molecular structure of the sample by Raman scattered light.

Model

T64000

Manufacture

HORIBA, LTD

Operating condition

Light source	Argon laser (wave length: 514.5 nm)
Microscope	Olympus BX41
CCD	Detector 3000

Lab.

Spectrochemical Analysis

FT-IR Spectrometer, Microscope/IR Imaging

The FT/IR-6100 offers the absolute highest level of performance in the industry with the highest signal-to-noise specifications. Designed for a wide range of critical research and development applications, each model is capable of measuring from the Near IR (15000 cm-1) to the Far IR (50 cm-1). Step scan, high resolution, and full vacuum options are available.

Model

FT-IR-6100, IRT-3000

Manufacture

JASCO International Co., Ltd

Operating condition