X-Ray & SEM
Field Emission Scanning Electron Microscope (FE-SEM)
The field emission scanning electron microscope enables the clear observation of the minute surface irregularity of solid samples beyond the reach of an optical microscope by scanning the surface with narrow electron beams after rendering it electrically conductive through the deposition of metal or carbon and by detecting and measuring the intensity of reflected electrons and secondary electrons. | ||||||||
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JSM-7600F | ||||||||
Manufacture | ||||||||
JEOL Ltd. | ||||||||
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Lab. | ||||||||
X-Ray & SEM |
X-ray Diffraction System (XRD)
X-ray Diffraction System is useful to identify major and/or clay minerals of rock samples. | ||||||||||
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X' Pert PRO MPD | ||||||||||
Manufacture | ||||||||||
Spectris Co., Ltd. | ||||||||||
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Lab. | ||||||||||
X-ray & SEM |
X-ray Fluorescence System(XRF)
X-ray Fluorescence is useful for measuring chemical composition of rock and sediment samples. | ||||||||||||||
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MagiX PRO | ||||||||||||||
Manufacture | ||||||||||||||
Spectris Co., Ltd. | ||||||||||||||
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Lab. | ||||||||||||||
X-ray & SEM |