X-Ray & SEM

Field Emission Scanning Electron Microscope (FE-SEM)

Field Emission Scanning Electron Microscope (FE-SEM)

The field emission scanning electron microscope enables the clear observation of the minute surface irregularity of solid samples beyond the reach of an optical microscope by scanning the surface with narrow electron beams after rendering it electrically conductive through the deposition of metal or carbon and by detecting and measuring the intensity of reflected electrons and secondary electrons.
Model
JSM-7600F
Manufacture
JEOL Ltd.
Operating condition
Resolution of SEI 1.0 nm (@ 15 kV)
Acceleration voltage 0.1 to 30 kV
Probe current 1 pA to 200 nA (@ 15 kV)
Available specimen holders for slide glasses, mini-core samples and micro fossils
Lab.
X-Ray & SEM

X-ray Diffraction System (XRD)

X-ray Diffraction System (XRD)

X-ray Diffraction System is useful to identify major and/or clay minerals of rock samples.
Model
X' Pert PRO MPD
Manufacture
Spectris Co., Ltd.
Operating condition
Detecto X' Celerator
Application X' Pert Datacollector
| Eθ angle setting | E/th> 5° | E75°
Sample Powdered rock (0.1g)
Sample changer 45 samples (Maximum)
Lab.
X-ray & SEM

X-ray Fluorescence System(XRF)

X-ray Fluorescence System(XRF)

X-ray Fluorescence is useful for measuring chemical composition of rock and sediment samples.
Model
MagiX PRO
Manufacture
Spectris Co., Ltd.
Operating condition
Crystal Changer Li200, Ge111, PE002, TlAp100 coated
Detector Flow detector, Xe Sealed detector, Scintilation Detector
Application SuperQ Manager
Sample preparation Glass beads (0.5g of sample + 5 g of Li2 B | O7)
Measured element Fe, Mn, Ti, Ca, K, P, Si, Al, Mg, Na
Measuring time 10 min/sample
Sample changer 60 samples (Maximum)
Lab.
X-ray & SEM
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